Therefore , an accurate determination of the complex refractive index of the material as a function of ge content is necessary 因此,需要精确的决定作为锗浓度函数的材料复数折射率。
Starting at the si substrate , these points are , on a point - to - point basis , converted into combinations of complex refractive index and depth in a numerical procedure 从硅衬底开始,这些点基于点对点,采用数字过程转换成复数折射率和深度的组合。
Leading into the complex refractive index and making use of the characteristic matrix method , the photonic bandgap of photonic crystal with the variety of the absorb is studied 摘要引入复折射率并利用特征矩阵法,研究了光子晶体的吸收对光子晶体能带的影响。
The present article has two goals : first , the determination of the dependence of the complex refractive index of sige alloys on the ge concentration , and second , the demonstration of the application of in situ ellipsometry during rie for depth profiling of the ge content 本文有两个目标:第一,决定锗硅合金的复数折射率与锗浓度的关系,第二,验证得到锗浓度的纵向分布的rie同步椭偏测量的应用。
As the size of particles increases , the scattering intensity increases ; as the size of particles increases , the horizontal polarization becomes unsymmetrical while vertical polarization invariable ; with the imaginary parts of complex refractive index increasing , the scattering intensity decreases 当粒子尺度增加时,散射光强增加;水平偏振变得不对称,而垂直偏振没有变化;当粒子的折射率虚部增加时,散射光强减少。
A coherent electromagnetic pulse in the range between the far - infrared and microwave region is used as a detection source . the amplitude of the wave is recorded by electro - optical or photoconductive sampling . after fast fourier transform , the amplitude and phase of the wave is given , then the complex refractive index standing for the absorption and dispersion of the material in thz region is extracted Thz ( 10 ~ ( 12 ) hz )时域光谱技术是20世纪90年代发展起来的一种新型的光谱测量技术,它使用频率介于远红外和微波之间的相干电磁辐射脉冲作为探测源,利用电光取样或光电导取样的方法直接记录thz辐射电场的振幅时间波形,通过傅立叶变换得到测量信号振幅和相位的光谱分布,进而获得材料在thz波段的复介电常数,即色散及吸收等信息。